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"Automatic fabric defect detection using a wide-and-light network."

Jun Wu et al. (2021)

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DOI: 10.1007/S10489-020-02084-6

access: closed

type: Journal Article

metadata version: 2022-12-07

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  dblp key:
  - journals/apin/WuLXZGLW21
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  - https://dblp.org/rec/journals/apin/WuLXZGLW21
Jun Wu, Juan Le, Zhitao Xiao, Fang Zhang, Lei Geng, Yanbei Liu, Wen Wang:
Automatic fabric defect detection using a wide-and-light network. Appl. Intell. 51(7): 4945-4961 (2021)

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