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"Rule-based data mining for yield improvement in semiconductor manufacturing."
Sholom M. Weiss et al. (2010)
- Sholom M. Weiss, Robert J. Baseman, Fateh Tipu, Christopher N. Collins, William A. Davies, Raminderpal Singh, John W. Hopkins:
Rule-based data mining for yield improvement in semiconductor manufacturing. Appl. Intell. 33(3): 318-329 (2010)
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