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"Monitoring high-yields processes with defects count in nonconforming items ..."

Babak Abbasi, Seyed Taghi Akhavan Niaki (2007)

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DOI: 10.1016/J.AMC.2006.09.114

access: closed

type: Journal Article

metadata version: 2020-02-21

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Babak Abbasi, Seyed Taghi Akhavan Niaki:
Monitoring high-yields processes with defects count in nonconforming items by artificial neural network. Appl. Math. Comput. 188(1): 262-270 (2007)

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