"Dynamic Line Scan Thermography Parameter Design via Gaussian Process ..."

Simon Verspeek et al. (2022)

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DOI: 10.3390/A15040102

access: open

type: Journal Article

metadata version: 2022-06-13

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Simon Verspeek, Ivan De Boi, Xavier Maldague, Rudi Penne, Gunther Steenackers:
Dynamic Line Scan Thermography Parameter Design via Gaussian Process Emulation. Algorithms 15(4): 102 (2022)

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