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"Predicting AFM Topography from Optical Microscope Images Using Deep-Learning."

Jaewoo Jeong et al. (2023)

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DOI: 10.1002/AISY.202200317

access: open

type: Journal Article

metadata version: 2023-03-21

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  dblp key:
  - journals/aisy/JeongKLL23a
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  persistent URL:
  - https://dblp.org/rec/journals/aisy/JeongKLL23a
Jaewoo Jeong, Taeyeong Kim, Bong Jae Lee, Jungchul Lee:
Predicting AFM Topography from Optical Microscope Images Using Deep-Learning. Adv. Intell. Syst. 5(1) (2023)

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