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"One class based feature learning approach for defect detection using deep ..."

Abdul Mujeeb et al. (2019)

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DOI: 10.1016/J.AEI.2019.100933

access: closed

type: Journal Article

metadata version: 2024-05-07

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Abdul Mujeeb, Wenting Dai, Marius Erdt, Alexei Sourin:
One class based feature learning approach for defect detection using deep autoencoders. Adv. Eng. Informatics 42 (2019)

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