"SMD LED chips defect detection using a YOLOv3-dense model."

Ssu-Han Chen, Chia-Chun Tsai (2021)

Details and statistics

DOI: 10.1016/J.AEI.2021.101255

access: closed

type: Journal Article

metadata version: 2023-09-30

a service of  Schloss Dagstuhl - Leibniz Center for Informatics