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"Silicon Proven 1.29 μm × 1.8 μm 65nm Sub-Vt Optical Sensor ..."

David Zooker et al. (2023)

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DOI: 10.1109/ACCESS.2023.3338001

access: open

type: Journal Article

metadata version: 2023-12-31

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David Zooker, Yoav Weizman, Alexander Fish, Osnat Keren:
Silicon Proven 1.29 μm × 1.8 μm 65nm Sub-Vt Optical Sensor for Hardware Security Applications. IEEE Access 11: 136269-136278 (2023)

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