"Silicon Proven 1.29 μm × 1.8 μm 65nm Sub-Vt Optical Sensor ..."

David Zooker et al. (2023)

> Home

Details and statistics

DOI: 10.1109/ACCESS.2023.3338001

access: open

type: Journal Article

metadata version: 2023-12-31

- view
  - electronic edition via DOI (open access)
  authority control:
- export record
  dblp key:
  - journals/access/ZookerWFK23
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/access/ZookerWFK23
David Zooker, Yoav Weizman, Alexander Fish, Osnat Keren:
Silicon Proven 1.29 μm × 1.8 μm 65nm Sub-Vt Optical Sensor for Hardware Security Applications. IEEE Access 11: 136269-136278 (2023)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.