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"Investigation of Inverse Piezoelectric Effect and Trap Effect in AlGaN/GaN ..."

Qing Zhu et al. (2020)

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DOI: 10.1109/ACCESS.2020.2975118

access: open

type: Journal Article

metadata version: 2024-06-14

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  - https://dblp.org/rec/journals/access/ZhuMHWZYZH20
Qing Zhu, Xiaohua Ma, Bin Hou, Mei Wu, Jiejie Zhu, Ling Yang, Meng Zhang, Yue Hao:
Investigation of Inverse Piezoelectric Effect and Trap Effect in AlGaN/GaN HEMTs Under Reverse-Bias Step Stress at Cryogenic Temperature. IEEE Access 8: 35520-35528 (2020)

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