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"Printed Circuit Boards Defect Detection Method Based on Improved Fully ..."

Jianfeng Zheng et al. (2022)

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DOI: 10.1109/ACCESS.2022.3214306

access: open

type: Journal Article

metadata version: 2023-09-30

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  dblp key:
  - journals/access/ZhengSZTQ22
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  - https://dblp.org/rec/journals/access/ZhengSZTQ22
Jianfeng Zheng, Xiaopeng Sun, Haixiang Zhou, Chenyang Tian, Hao Qiang:
Printed Circuit Boards Defect Detection Method Based on Improved Fully Convolutional Networks. IEEE Access 10: 109908-109918 (2022)

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