"Study on a Simulation Method for IGBT Bonded Wire Cracking Under Power ..."

Shengjun Zhao et al. (2024)

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DOI: 10.1109/ACCESS.2024.3519663

access: open

type: Journal Article

metadata version: 2025-01-25

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Shengjun Zhao, Qi Wang, Tong An, Fei Qin:
Study on a Simulation Method for IGBT Bonded Wire Cracking Under Power Cycling Conditions Considering the Effect of Damage Evolution. IEEE Access 12: 196105-196117 (2024)

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