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"Detecting Memory Life-Cycle Bugs With Extended Define-Use Chain Analysis."

Gen Zhang (2020)

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DOI: 10.1109/ACCESS.2020.2999351

access: open

type: Journal Article

metadata version: 2023-08-28

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Gen Zhang:
Detecting Memory Life-Cycle Bugs With Extended Define-Use Chain Analysis. IEEE Access 8: 114968-114980 (2020)

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