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"Multi-Frequency Test Generation for Incipient Faults in Analog Circuits ..."

Yang Yu, Yueming Jiang, Xiyuan Peng (2018)

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DOI: 10.1109/ACCESS.2018.2849697

access: open

type: Journal Article

metadata version: 2020-07-30

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Yang Yu, Yueming Jiang, Xiyuan Peng:
Multi-Frequency Test Generation for Incipient Faults in Analog Circuits Based on the Aliasing Measuring Model. IEEE Access 6: 34724-34735 (2018)

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