"SECURE: A Segmentation Quality Evaluation Metric on SEM Images for Reverse ..."

Ronald Wilson et al. (2023)

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DOI: 10.1109/ACCESS.2023.3340618

access: open

type: Journal Article

metadata version: 2024-01-13

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Ronald Wilson, Olivia P. Dizon-Paradis, Domenic Forte, Damon L. Woodard:
SECURE: A Segmentation Quality Evaluation Metric on SEM Images for Reverse Engineering on Integrated Circuits. IEEE Access 11: 137798-137809 (2023)

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