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"Charge Loss Induced by Defects of Transition Layer in Charge-Trap 3D NAND ..."

Fei Wang et al. (2021)

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DOI: 10.1109/ACCESS.2021.3067930

access: open

type: Journal Article

metadata version: 2021-04-29

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Fei Wang, Yuan Li, Xiaolei Ma, Jiezhi Chen:
Charge Loss Induced by Defects of Transition Layer in Charge-Trap 3D NAND Flash Memory. IEEE Access 9: 47391-47398 (2021)

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