"IETCR: An Information Entropy Based Test Case Reduction Strategy for ..."

Haifeng Wang et al. (2020)

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DOI: 10.1109/ACCESS.2020.3004145

access: open

type: Journal Article

metadata version: 2024-03-20

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Haifeng Wang, Bin Du, Jie He, Yong Liu, Xiang Chen:
IETCR: An Information Entropy Based Test Case Reduction Strategy for Mutation-Based Fault Localization. IEEE Access 8: 124297-124310 (2020)

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