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"New Diagnostic Forensic Protocol for Damaged Secure Digital Memory Cards."

Fabien Thomas-Brans et al. (2022)

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DOI: 10.1109/ACCESS.2022.3158958

access: open

type: Journal Article

metadata version: 2023-09-30

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Fabien Thomas-Brans, Thibaut Heckmann, Konstantinos Markantonakis, Damien Sauveron:
New Diagnostic Forensic Protocol for Damaged Secure Digital Memory Cards. IEEE Access 10: 33742-33757 (2022)

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