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"New Diagnostic Forensic Protocol for Damaged Secure Digital Memory Cards."
Fabien Thomas-Brans et al. (2022)
- Fabien Thomas-Brans, Thibaut Heckmann, Konstantinos Markantonakis, Damien Sauveron:
New Diagnostic Forensic Protocol for Damaged Secure Digital Memory Cards. IEEE Access 10: 33742-33757 (2022)
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