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"A Review of Knowledge-Based Defect Identification via PRPD Patterns in ..."

Tohid Shahsavarian et al. (2021)

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DOI: 10.1109/ACCESS.2021.3082858

access: open

type: Journal Article

metadata version: 2021-06-15

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  - https://dblp.org/rec/journals/access/ShahsavarianPZP21
Tohid Shahsavarian, Yue Pan, Zhousheng Zhang, Cheng Pan, Hadi Naderiallaf, Jim Guo, Chuanyang Li, Yang Cao:
A Review of Knowledge-Based Defect Identification via PRPD Patterns in High Voltage Apparatus. IEEE Access 9: 77705-77728 (2021)

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