![](https://dblp.uni-trier.de/img/logo.ua.320x120.png)
![](https://dblp.uni-trier.de/img/dropdown.dark.16x16.png)
![](https://dblp.uni-trier.de/img/peace.dark.16x16.png)
Остановите войну!
for scientists:
![search dblp search dblp](https://dblp.uni-trier.de/img/search.dark.16x16.png)
![search dblp](https://dblp.uni-trier.de/img/search.dark.16x16.png)
default search action
"Design Criteria of High-Temperature Integrated Circuits Using Standard SOI ..."
Christian Sbrana et al. (2024)
- Christian Sbrana, Alessandro Catania
, Maksym Paliy, Stefano Di Pascoli
, Sebastiano Strangio
, Massimo Macucci
, Giuseppe Iannaccone
:
Design Criteria of High-Temperature Integrated Circuits Using Standard SOI CMOS Process up to 300°C. IEEE Access 12: 57236-57249 (2024)
![](https://dblp.uni-trier.de/img/cog.dark.24x24.png)
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.