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"Soft Error Reliability Improvement of Digital Circuits by Exploiting a ..."

Mohsen Raji, M. Amin Sabet, Behnam Ghavami (2019)

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DOI: 10.1109/ACCESS.2019.2902505

access: open

type: Journal Article

metadata version: 2019-07-05

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  dblp key:
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  - https://dblp.org/rec/journals/access/RajiSG19
Mohsen Raji, M. Amin Sabet, Behnam Ghavami:
Soft Error Reliability Improvement of Digital Circuits by Exploiting a Fast Gate Sizing Scheme. IEEE Access 7: 66485-66495 (2019)

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