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"Self-Heating and Corner Rounding Effects on Time Dependent Dielectric ..."

Jae Won Lim et al. (2023)

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DOI: 10.1109/ACCESS.2023.3297493

access: open

type: Journal Article

metadata version: 2023-08-18

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Jae Won Lim, Changhyun Yoo, Kiron Park, Jongwook Jeon:
Self-Heating and Corner Rounding Effects on Time Dependent Dielectric Breakdown of Stacked Multi-Nanosheet FETs. IEEE Access 11: 82208-82215 (2023)

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