"Probabilistic Artificial Neural Network for Line-Edge-Roughness-Induced ..."

Jaehyuk Lim, Jinwoong Lee, Changhwan Shin (2021)

> Home

Details and statistics

DOI: 10.1109/ACCESS.2021.3088461

access: open

type: Journal Article

metadata version: 2021-07-13

- view
  - electronic edition via DOI (open access)
  authority control:
- export record
  dblp key:
  - journals/access/LimLS21
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/access/LimLS21
Jaehyuk Lim, Jinwoong Lee, Changhwan Shin:
Probabilistic Artificial Neural Network for Line-Edge-Roughness-Induced Random Variation in FinFET. IEEE Access 9: 86581-86589 (2021)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.