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"Time-Variant Reliability Optimization for Stress Balance in Press-Pack ..."
Hangyang Li et al. (2023)
- Hangyang Li
, Tongguang Yang
, Xinglin Liu, Jingyi Zhong, Jiaxin Mo, Han Zhou, Zhongkun Xiao:
Time-Variant Reliability Optimization for Stress Balance in Press-Pack Insulated Gate Bipolar Transistors. IEEE Access 11: 98059-98069 (2023)
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