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"A Thermal Failure Model for MOSFETs Under Repetitive Electromagnetic Pulses."
Yong Li et al. (2020)
- Yong Li, Haiyan Xie, Hui Yan, Jianguo Wang, Zhiqiang Yang:
A Thermal Failure Model for MOSFETs Under Repetitive Electromagnetic Pulses. IEEE Access 8: 228245-228254 (2020)
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