"An Improved YOLOv7-Tiny-Based Algorithm for Wafer Surface Defect Detection."

Mengyun Li et al. (2025)

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DOI: 10.1109/ACCESS.2025.3528242

access: open

type: Journal Article

metadata version: 2025-02-14

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Mengyun Li, Xueying Wang, Hongtao Zhang, Xiaofeng Hu:
An Improved YOLOv7-Tiny-Based Algorithm for Wafer Surface Defect Detection. IEEE Access 13: 10724-10734 (2025)

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