"Investigation Into the Degradation of DDR4 DRAM Owing to Total Ionizing ..."

Gyeongyeop Lee et al. (2023)

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DOI: 10.1109/ACCESS.2023.3312926

access: open

type: Journal Article

metadata version: 2023-10-14

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Gyeongyeop Lee, Minki Suh, Minsang Ryu, Yunjong Lee, Jin-Woo Han, Jungsik Kim:
Investigation Into the Degradation of DDR4 DRAM Owing to Total Ionizing Dose Effects. IEEE Access 11: 97456-97465 (2023)

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