"Design and Implementation of Test Infrastructure for Higher Parallel Wafer ..."

Seunghan Lee, Jin Hwan Park, Young-Woo Lee (2025)

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DOI: 10.1109/ACCESS.2025.3544246

access: open

type: Journal Article

metadata version: 2025-04-01

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Seunghan Lee, Jin Hwan Park, Young-Woo Lee:
Design and Implementation of Test Infrastructure for Higher Parallel Wafer Level Testing of System-on-Chip. IEEE Access 13: 37493-37500 (2025)

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