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"Influence of Hole Current Crowding on Snapback Breakdown in Multi-Finger ..."
Siyoun Lee et al. (2023)
- Siyoun Lee
, Seong-Yeon Kim, Haesoon Oh, Jaesung Sim, Woo Young Choi
:
Influence of Hole Current Crowding on Snapback Breakdown in Multi-Finger MOSFETs. IEEE Access 11: 60758-60762 (2023)
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