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"Investigation on the Effects of Interconnect RC in 3nm Technology Node ..."
Yeji Lee et al. (2022)
- Yeji Lee, Wonyeong Jang
, Kyungbae Kwon, Jihun Park, Changhyun Yoo
, Jeesoo Chang
, Jongwook Jeon
:
Investigation on the Effects of Interconnect RC in 3nm Technology Node Using Path-Finding Process Design Kit. IEEE Access 10: 80695-80702 (2022)
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