"SMC-YOLO: Surface Defect Detection of PCB Based on Multi-Scale Features ..."

Wei-Bin Kong et al. (2024)

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DOI: 10.1109/ACCESS.2024.3434559

access: open

type: Journal Article

metadata version: 2024-10-22

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Wei-Bin Kong, Zhi-Fei Zhang, Ting-Lin Zhang, Lei Wang, Zi-Yao Cheng, Mo Zhou:
SMC-YOLO: Surface Defect Detection of PCB Based on Multi-Scale Features and Dual Loss Functions. IEEE Access 12: 137667-137682 (2024)

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