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"An Investigation of Frequency Dependent Reliability and Failure Mechanism ..."
Roshan L. Kini et al. (2020)
- Roshan L. Kini
, Shankar Dhakal, Sadab Mahmud
, Andrew J. Sellers
, Michael R. Hontz
, Cheikh A. Tine, Raghav Khanna
:
An Investigation of Frequency Dependent Reliability and Failure Mechanism of pGaN Gated GaN HEMTs. IEEE Access 8: 137312-137321 (2020)
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