Stop the war!

Остановите войну!

for scientists:

default search action

combined dblp search
author search
venue search
publication search

ask others

"Wafer Edge Yield Prediction Using a Combined Long Short-Term Memory and ..."

Dasol Kim, Mintae Kim, Wooju Kim (2020)

> Home

Details and statistics

DOI: 10.1109/ACCESS.2020.3040426

access: open

type: Journal Article

metadata version: 2020-12-17

- view
  - electronic edition via DOI (open access)
  authority control:
- export record
  dblp key:
  - journals/access/KimKK20c
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/access/KimKK20c
Dasol Kim, Mintae Kim, Wooju Kim:
Wafer Edge Yield Prediction Using a Combined Long Short-Term Memory and Feed- Forward Neural Network Model for Semiconductor Manufacturing. IEEE Access 8: 215125-215132 (2020)

a service of

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.