"Riding the IoT Wave With VFuzz: Discovering Security Flaws in Smart Homes."

Carlos Nkuba Kayembe et al. (2022)

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DOI: 10.1109/ACCESS.2021.3138768

access: open

type: Journal Article

metadata version: 2022-01-21

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Carlos Nkuba Kayembe, Seulbae Kim, Sven Dietrich, Heejo Lee:
Riding the IoT Wave With VFuzz: Discovering Security Flaws in Smart Homes. IEEE Access 10: 1775-1789 (2022)

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