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"Statistical Strategies to Capture Correlation Between Overshooting Effect ..."

Hamed Jooypa, Daryoosh Dideban, Hadi Heidari (2021)

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DOI: 10.1109/ACCESS.2021.3076202

access: open

type: Journal Article

metadata version: 2021-05-16

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Hamed Jooypa, Daryoosh Dideban, Hadi Heidari:
Statistical Strategies to Capture Correlation Between Overshooting Effect and Propagation Delay Time in Nano-CMOS Inverters. IEEE Access 9: 65340-65345 (2021)

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