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"A Hybrid Technique Based on ECC and Hardened Cells for Tolerating Random ..."

Daniel Gil-Tomas et al. (2024)

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DOI: 10.1109/ACCESS.2024.3402532

access: open

type: Journal Article

metadata version: 2024-06-18

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Daniel Gil-Tomas, Luis J. Saiz-Adalid, Joaquin Gracia-Moran, Juan-Carlos Baraza-Calvo, Pedro J. Gil-Vicente:
A Hybrid Technique Based on ECC and Hardened Cells for Tolerating Random Multiple-Bit Upsets in SRAM Arrays. IEEE Access 12: 70662-70675 (2024)

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