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"Automated Parallel Test Forms Assembly using Zero-suppressed Binary ..."

Kazuma Fuchimoto, Shin-ichi Minato, Maomi Ueno (2023)

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DOI: 10.1109/ACCESS.2023.3322720

access: open

type: Journal Article

metadata version: 2023-10-27

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Kazuma Fuchimoto, Shin-ichi Minato, Maomi Ueno:
Automated Parallel Test Forms Assembly using Zero-suppressed Binary Decision Diagrams. IEEE Access 11: 112804-112813 (2023)

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