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"Strain-Reduction Induced Rise in Channel Temperature at Ohmic Contacts of ..."

Steven J. Duffy et al. (2018)

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DOI: 10.1109/ACCESS.2018.2861323

access: open

type: Journal Article

metadata version: 2022-12-16

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  - https://dblp.org/rec/journals/access/DuffyBKBZBS18
Steven J. Duffy, Brahim Benbakhti, Karol Kalna, Mohammed Boucherta, Wei Dong Zhang, Nour-Eddine Bourzgui, Ali Soltani:
Strain-Reduction Induced Rise in Channel Temperature at Ohmic Contacts of GaN HEMTs. IEEE Access 6: 42721-42728 (2018)

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