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"A Non-Blocking Non-Degrading Multiple Defects Link Testing Method for ..."
Khanh N. Dang et al. (2020)
- Khanh N. Dang, Michael Conrad Meyer, Akram Ben Ahmed, Abderazek Ben Abdallah, Xuan-Tu Tran:
A Non-Blocking Non-Degrading Multiple Defects Link Testing Method for 3D-Networks-on-Chip. IEEE Access 8: 59571-59589 (2020)
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