"Robust Inspection of Integrated Circuit Substrates Based on Twin Network ..."

Eunjeong Choi, Jeongtae Kim (2023)

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DOI: 10.1109/ACCESS.2023.3290914

access: open

type: Journal Article

metadata version: 2023-07-21

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Eunjeong Choi, Jeongtae Kim:
Robust Inspection of Integrated Circuit Substrates Based on Twin Network With Image Transform and Suppression Modules. IEEE Access 11: 66017-66027 (2023)

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