"Analysis of Bias Temperature Instability in Peripheral CMOS Devices for ..."

Jung Rae Cho et al. (2025)

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DOI: 10.1109/ACCESS.2025.3605829

access: open

type: Journal Article

metadata version: 2025-10-15

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Jung Rae Cho, Seungwon Go, Jingyu Park, Tae Jun Yang, Seonhaeng Lee, Namhyun Lee, Dong Keun Lee, Yoon Kim, Myounggon Kang, Rock-Hyun Baek, Changhyun Kim, Sangwan Kim, Dae Hwan Kim:
Analysis of Bias Temperature Instability in Peripheral CMOS Devices for Low-Temperature Memory Applications. IEEE Access 13: 156497-156503 (2025)

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