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"Slow Degradation Fault Detection in a Harsh Environment."

Anthony D. Cho et al. (2020)

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DOI: 10.1109/ACCESS.2020.3026348

access: open

type: Journal Article

metadata version: 2022-06-23

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Anthony D. Cho, Rodrigo A. Carrasco, Gonzalo A. Ruz, José Luis Ortiz:
Slow Degradation Fault Detection in a Harsh Environment. IEEE Access 8: 175904-175920 (2020)

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