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"Fast Near-Interface Traps in 4H-SiC MOS Capacitors Measured by an ..."

Mayank Chaturvedi et al. (2021)

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DOI: 10.1109/ACCESS.2021.3102614

access: open

type: Journal Article

metadata version: 2022-01-03

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Mayank Chaturvedi, Sima Dimitrijev, Hamid Amini Moghadam, Daniel Haasmann, Peyush Pande, Utkarsh Jadli:
Fast Near-Interface Traps in 4H-SiC MOS Capacitors Measured by an Integrated-Charge Method. IEEE Access 9: 109745-109753 (2021)

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