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"Test Scheduling and Test Time Minimization of System-on-Chip Using ..."

Gokul Chandrasekaran et al. (2022)

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DOI: 10.1109/ACCESS.2022.3224924

access: open

type: Journal Article

metadata version: 2023-06-26

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  - journals/access/ChandrasekaranK22
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  - https://dblp.org/rec/journals/access/ChandrasekaranK22
Gokul Chandrasekaran, Neelam Sanjeev Kumar, Karthikeyan Panjappagounder Rajamanickam, Vanchinathan Kumarasamy, Neeraj Priyadarshi, Bhekisipho Twala:
Test Scheduling and Test Time Minimization of System-on-Chip Using Modified BAT Algorithm. IEEE Access 10: 126199-126216 (2022)

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