Stop the war!

Остановите войну!

for scientists:

default search action

combined dblp search
author search
venue search
publication search

ask others

"Reliability Analysis for Electronic Devices Using Generalized Exponential ..."

Sajid Ali et al. (2020)

> Home

Details and statistics

DOI: 10.1109/ACCESS.2020.3000951

access: open

type: Journal Article

metadata version: 2023-10-04

- view
  - electronic edition via DOI (open access)
  authority control:
- export record
  dblp key:
  - journals/access/AliASSSR20
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/access/AliASSSR20
Sajid Ali, Shafaqat Ali, Ismail Shah, Ghazanfar Farooq Siddiqui, Tanzila Saba, Amjad Rehman:
Reliability Analysis for Electronic Devices Using Generalized Exponential Distribution. IEEE Access 8: 108629-108644 (2020)

a service of

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.