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"High Quality Uniform Random Number Generation Using LUT Optimised ..."

David B. Thomas, Wayne Luk (2007)

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DOI: 10.1007/S11265-006-0014-9

access: closed

type: Journal Article

metadata version: 2020-05-20

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David B. Thomas, Wayne Luk:
High Quality Uniform Random Number Generation Using LUT Optimised State-transition Matrices. J. VLSI Signal Process. 47(1): 77-92 (2007)

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