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"Realizing a high measure of confidence for defect level analysis of random ..."

Wen-Ben Jone, Paresh Gondalia, Allan Gutjahr (1995)

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DOI: 10.1109/92.407003

access: closed

type: Journal Article

metadata version: 2020-03-11

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Wen-Ben Jone, Paresh Gondalia, Allan Gutjahr:
Realizing a high measure of confidence for defect level analysis of random testing [VLSI]. IEEE Trans. Very Large Scale Integr. Syst. 3(3): 446-450 (1995)

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