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"Application of a Failure Driven Test Profile in Random Testing."

Tsong Yueh Chen, Fei-Ching Kuo, Huai Liu (2009)

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DOI: 10.1109/TR.2008.2011687

access: closed

type: Journal Article

metadata version: 2020-07-09

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Tsong Yueh Chen, Fei-Ching Kuo, Huai Liu:
Application of a Failure Driven Test Profile in Random Testing. IEEE Trans. Reliab. 58(1): 179-192 (2009)

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