"Statistics- and Spatiality-Based Feature Distance Measure for Error ..."

Shuiming Ye, Qibin Sun, Ee-Chien Chang (2007)

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DOI: 10.1007/978-3-540-73092-7_3

access: closed

type: Journal Article

metadata version: 2020-05-15

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Shuiming Ye, Qibin Sun, Ee-Chien Chang:
Statistics- and Spatiality-Based Feature Distance Measure for Error Resilient Image Authentication. Trans. Data Hiding Multim. Secur. 2: 48-67 (2007)

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