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"An Efficient SoC Test Technique by Reusing On/Off-Chip Bus Bridge."

Jaehoon Song et al. (2009)

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DOI: 10.1109/TCSI.2008.2002550

access: closed

type: Journal Article

metadata version: 2020-05-22

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Jaehoon Song, Hyunbean Yi, Juhee Han, Sungju Park:
An Efficient SoC Test Technique by Reusing On/Off-Chip Bus Bridge. IEEE Trans. Circuits Syst. I Regul. Pap. 56-I(3): 554-565 (2009)

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