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"A limited exponential complexity algorithm for increasing the testability ..."

Irith Pomeranz, Zvi Kohavi (1992)

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DOI: 10.1109/43.124403

access: closed

type: Journal Article

metadata version: 2020-09-24

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Irith Pomeranz, Zvi Kohavi:
A limited exponential complexity algorithm for increasing the testability of digital circuits by testing-module insertion. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 11(2): 247-259 (1992)

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